Ключевые слова: buffer layers, fabrication, manganites, films epitaxial, substrate SrTiO3, PLD process, Raman spectroscopy, HTS, GdBCO, tapes
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Schneider M., Vertelis V., Balevicius S., Stankevic V., Zurauskiene N., Simkevicius C., Stankevic T., Plausinaitiene V., Tolvaisiene S.
Ключевые слова: HTS, YBCO, GdBCO, EuBCO, SmBCO, YbBCO, DyBCO, buffer layers, MOD process, fluorine-free process, substrate Hastelloy, coated conductors, fabrication, X-ray diffraction, lattice parameter, microstructure, critical current density, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, experimental results
Ключевые слова: chalcogenide, thin films, coated conductors, fabrication, substrate metallic, PLD process, review, IBAD process, buffer layers, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy, X-ray diffraction, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, pinning force, microstructure, experimental results
Ключевые слова: coated conductors, fabrication, MOD process, cap layers, manganites, buffer layers, critical caracteristics, X-ray diffraction, roughness, surface, lattice parameter, critical current density, temperature dependence, microstructure, critical current, distribution, experimental results, HTS, YBCO
Ключевые слова: HTS, NdBCO, doping effect, heat treatment, thermal stability, thin films, substrate single crystal, buffer layers, YBCO, seeding technique, SmBCO, MOCVD process, X-ray diffraction, fabrication
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, X-ray diffraction, PLD process, microstructure, fabrication
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